Stacking faults and microstrain in La1.85M0.15CuO4 (M = Ca, Ba, Sr) by analyzing X-ray diffraction line broadening

✍ Scribed by Davor Balzar; Hassel Ledbetter; Alexana Roshko

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 130 KB
• Volume: 185-189
• Category: Article
• ISSN: 0921-4534
• DOI: 10.1016/0921-4534(91)91659-r