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External ion source FTMS instrument for analysis of high mass ions

✍ Scribed by Carlito B. Lebrilla; I.J. Amster; Robert T. McIver Jr.

Publisher: Elsevier Science
Year: 1989
Tongue: English
Weight: 409 KB
Volume: 87
Category: Article
ISSN: 0168-1176
DOI: 10.1016/0168-1176(89)80014-x

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