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Extension of frequency measurements with Schottky diodes to the 4 THz range

โœ Scribed by C. O. Weiss; A. Godone

Publisher
Springer
Year
1982
Tongue
English
Weight
109 KB
Volume
27
Category
Article
ISSN
0721-7269

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Measurement of dielectric permittivity w
Measurement of dielectric permittivity with time domain reflectometry. Extension of the method to lower relaxation frequencies
โœ G.P. De Loor; M.J.C. Van Gemert; H. Gravesteyn ๐Ÿ“‚ Article ๐Ÿ“… 1973 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 402 KB

A new method is sugestcd to determine the dielectric permittivity OF materials, by means of time domain reflectomztry (TDR), for frequencies IJ 2 4 X 10' Hz independent of the value of the rclasntion frequency involved. The method uses the whole set of reflections from a dielectric sample which is