Extended selection of switching target faults in CONT algorithm for test generation

✍ Scribed by Yuzo Takamatsu; Kozo Kinoshita

• Publisher: Springer US
• Year: 1990
• Tongue: English
• Weight: 594 KB
• Volume: 1
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1007/bf00153855