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Extended defects in natural diamonds: An Atomic Force Microscopy investigation

✍ Scribed by Gainutdinov, Radmir V.; Shiryaev, Andrey A.; Boyko, Vladimir S.; Fedortchouk, Yana


Book ID
121254738
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
784 KB
Volume
40
Category
Article
ISSN
0925-9635

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The surface morphology and metallic contamination of magnetron sputter-etched Si(111) was investigated by atomic force microscopy (AFM) and high-resolution Rutherford backscattering spectroscopy (RBS) as a function of Ar plasma pressure. The root-mean-square roughness (R rms ) of plasma-etched Si de