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Exploration of Power Device Reliability Using Compact Device Models and Fast Electrothermal Simulation

โœ Scribed by Bryant, A.T.; Mawby, P.A.; Palmer, P.R.; Santi, E.; Hudgins, J.L.

Book ID
117917693
Publisher
IEEE
Year
2008
Tongue
English
Weight
932 KB
Volume
44
Category
Article
ISSN
0093-9994

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## Abstract In power stations and substations of electric power companies, power semiconductor devices such as diodes and thyristors have been used in control power supplies and emergency power supplies since the 1970s. Such equipment is designed on the assumption that power semiconductor devices a