Abstmet A previously described expert system for the voltammetric determination of Cu, Zn, Cd, Pb, In, Ni, Co, Tl, Hg, V, Se, Te, Cr(III), Cr(V), As(W) and As(V) is enlarged and improved by including methods for the determination of total Fe, Mn(II), Al and Ti. Pulse polarographic and stripping volt
Expert system for the voltammetric determination of trace metals: Part III. Methods for determining mercury, selenium and vanadium
✍ Scribed by M. Esteban; C. Ariño; I. Ruisánchez; M.S. Larrechi; F.X. Rius
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 650 KB
- Volume
- 284
- Category
- Article
- ISSN
- 0003-2670
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✦ Synopsis
A previously described expert system for the voltammetric determination of Cu, Zn, Cd, Pb, In, Ni, Co and Tl is enhanced and improved by means of the addition of methods for Hg, V and Se (optionally also Tel. Special attention is paid to the determination of V, inside a wide concentration range, in different types of samples. The system guides the user in the choice of sample treatment and the most appropriate voltannnetric procedure for the identification and the quantification of the trace metals. The techniques implemented are differential pulse polarography, anodic stripping voltannnetry, cathodic stripping voltammetry and adsorptive stripping voltammetry, using mercury drop electrodes and a gold electrode (for the determination of Hg). For the identification and resolution of overlapping peaks (Cd and In), the system may call two external programs, written in turbobasic. Quantification is carried out by means of the multiple standard addition method, and the quality of the calibration plot is tested by several statistical validation tests. The expert system is developed using KES &nowledge engineering system).
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An expert system for the voltammetnc detemunatlon of Cu, Zn, Cd, Pb, In, NI, Co and Tl was developed unth special attention to methods for determmmg NI, Co and Tl at different concentration ratios The system guides the user m the choice of sample treatment, the most appropnate voltammetnc procedure
An expert system for the voltammetnc deternunatlon of Cu, Zn, Cd, Pb and In was developed The system guides the user m the choice of sample treatment, the most appropriate voltammetric procedure and the ldentlficatlon and determination of the trace metals The techniques implemented are differential-