A previously described expert system for the voltammetric determination of Cu, Zn, Cd, Pb, In, Ni, Co and Tl is enhanced and improved by means of the addition of methods for Hg, V and Se (optionally also Tel. Special attention is paid to the determination of V, inside a wide concentration range, in
Expert system for the voltammetric determination of trace metals: Part II. Methods for determining nickel cobalt and thallium at different concentration ratios
✍ Scribed by M. Esteban; I. Ruisánchez; M.S. Larrechi; F.X. Rius
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 542 KB
- Volume
- 268
- Category
- Article
- ISSN
- 0003-2670
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✦ Synopsis
An expert system for the voltammetnc detemunatlon of Cu, Zn, Cd, Pb, In, NI, Co and Tl was developed unth special attention to methods for determmmg NI, Co and Tl at different concentration ratios The system guides the user m the choice of sample treatment, the most appropnate voltammetnc procedure and the IdenMicatlon and determmatlon of trace metals The techniques implemented are dtierentml-pulse polarography, anod~c stnppmg voltammetry and adsorptive stnppmg voltammetry, using mercury drop electrodes Only well known methods are recommended, with particular attention to standard methods For the ldentdicatlon and resolution of overlapping peaks, the system may be used m conJunction wrath two external programs, wntten m turbo BASIC Quantticafion 1s camed out by means of the multiple standard addition method, and the quahty of the calibration graph IS tested by several statistical tests performed by another external program The expert system IS developed using KES (Knowledge Engmeenng System)
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Abstmet A previously described expert system for the voltammetric determination of Cu, Zn, Cd, Pb, In, Ni, Co, Tl, Hg, V, Se, Te, Cr(III), Cr(V), As(W) and As(V) is enlarged and improved by including methods for the determination of total Fe, Mn(II), Al and Ti. Pulse polarographic and stripping volt
An expert system for the voltammetnc deternunatlon of Cu, Zn, Cd, Pb and In was developed The system guides the user m the choice of sample treatment, the most appropriate voltammetric procedure and the ldentlficatlon and determination of the trace metals The techniques implemented are differential-