Experimentally-based analytical model of deep-submicron LDD pMOSFETs in a Bi-MOS hybrid-mode environment

✍ Scribed by Rofail, S.S.; Yeo Kiat Seng

• Book ID: 114536946
• Publisher: IEEE
• Year: 1997
• Tongue: English
• Weight: 390 KB
• Volume: 44
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.622604