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Effective channel length and external series resistance models of scaled LDD pMOSFETs operating in a Bi-MOS hybrid-mode environment

✍ Scribed by Seah, S.H.L.; Kiat Seng Yeo; Jian Guo Fia; Manh Anh Do


Book ID
114538667
Publisher
IEEE
Year
2001
Tongue
English
Weight
126 KB
Volume
48
Category
Article
ISSN
0018-9383

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