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Experimental Validations of a Simple PCB Interconnect Model for High-Rate Signal Integrity

✍ Scribed by Eudes, T.; Ravelo, B.; Louis, A.

Book ID: 114625015
Publisher: IEEE
Year: 2012
Tongue: English
Weight: 676 KB
Volume: 54
Category: Article
ISSN: 0018-9375
DOI: 10.1109/temc.2011.2165216

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