Experimental validation of a large-signal MESFET model for submicron-gate-length devices

✍ Scribed by Stefano D'Agostino; Claudio Paoloni

• Publisher: John Wiley and Sons
• Year: 1997
• Tongue: English
• Weight: 124 KB
• Volume: 15
• Category: Article
• ISSN: 0895-2477
• DOI: 10.1002/(sici)1098-2760(199707)15:4<227::aid-mop11>3.0.co;2-4

✦ Synopsis

Parameters of Gaps in the NRD Waveguide Dielectric ⑀ = 2.56, t = 2.7 mm, 2w = 2.4 mm, frequency = 50 GHz r