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Experimental measurements of electron scattering parameters in Cu narrow lines

✍ Scribed by S. Maîtrejean; R. Gers; T. Mourier; A. Toffoli; G. Passemard

Book ID: 108207678
Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 377 KB
Volume: 83
Category: Article
ISSN: 0167-9317
DOI: 10.1016/j.mee.2006.10.044

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