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Experimental evaluation of microwave field-effect-transistor noise models

โœ Scribed by Heymann, P.; Rudolph, M.; Prinzler, H.; Doerner, R.; Klapproth, L.; Bock, G.


Book ID
114553328
Publisher
IEEE
Year
1999
Tongue
English
Weight
355 KB
Volume
47
Category
Article
ISSN
0018-9480

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