Experimental evaluation of a spherical aberration-corrected TEM and STEM

✍ Scribed by Sawada, Hidetaka ;Tomita, Takeshi ;Naruse, Mikio ;Honda, Toshikazu ;Hambridge, Paul ;Hartel, Peter ;Haider, Maximilian ;Hetherington, Crispin ;Doole, Ron ;Kirkland, Angus ;Hutchison, John ;Titchmarsh, John ;Cockayne, David

• Book ID: 121496690
• Publisher: Oxford University Press
• Year: 2005
• Tongue: English
• Weight: 368 KB
• Volume: 54
• Category: Article
• ISSN: 2050-5698
• DOI: 10.1093/jmicro/dfi001