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Experimental determination of the composition depth profile of AuCu alloys via auger electron spectroscopy

✍ Scribed by S. Mróz


Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
477 KB
Volume
59
Category
Article
ISSN
0079-6816

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In-depth composition profiles of the an&c oxide films grown on Al (1 I1 ), (I 10) and (100) single crystal electrodes in ammonium borate were studied by Auger electron spectroscopy with Ar ion etching. The oxide film had the composition of Ai,O, as referenced to an authentic a-Al,O, single crystal.