Experimental characterization of on-chip inductor and capacitor interconnect: part II. Shunt case

✍ Scribed by Yin, W.Y.; Li, L.W.; Pan, S.J.; Gan, Y.B.

• Book ID: 114649754
• Publisher: IEEE
• Year: 2004
• Tongue: English
• Weight: 914 KB
• Volume: 40
• Category: Article
• ISSN: 0018-9464
• DOI: 10.1109/tmag.2004.826627