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Experimental characterization of on-chip inductor and capacitor interconnect: part I. Series case

✍ Scribed by Wen-Yan Yin; Shujan Pan; Le-Wei Li; Yeow-Beng Gan; Ban-Leong Ooi

Book ID: 114649728
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 570 KB
Volume: 39
Category: Article
ISSN: 0018-9464
DOI: 10.1109/tmag.2003.819468

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