Experimental characterization and modelling of electromigration lifetime under unipolar pulsed current stress

✍ Scribed by Meng Keong Lim; Jingyuan Lin; Yong Chiang Ee; Chee Mang Ng; Jun Wei; Chee Lip Gan

• Book ID: 119326633
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 1014 KB
• Volume: 52
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2011.12.026