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Experimental and theoretical analysis of the temperature dependence of the two-dimensional electron mobility in a strained Si quantum well

✍ Scribed by Tanaka, Takahisa; Tsuchiya, Go; Hoshi, Yusuke; Sawano, Kentarou; Shiraki, Yasuhiro; Itoh, Kohei M.


Book ID
120586087
Publisher
American Institute of Physics
Year
2012
Tongue
English
Weight
700 KB
Volume
111
Category
Article
ISSN
0021-8979

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