𝔖 Bobbio Scriptorium

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Experimental analysis of residual stresses in semiconductor materials : Chambonnet, D.; Gauthier, R.; M'Ghaieth, R.; Pinard, P. Residual stresses in science and technology. Proceedings of the international conference, Garmisch-Partenkirchen (FRG), Oct. 1986. pp. 343–352. Deutsche Gesellschaft fur metallkunde, 1059 pp. (1987)

Publisher: Elsevier Science
Year: 1989
Weight: 167 KB
Volume: 22
Category: Article
ISSN: 0308-9126
DOI: 10.1016/0308-9126(89)91206-6

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