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Experimental analysis of residual stresses in semiconductor materials : 38267 Chambonnet, D.; Gauthier, R.; M'Ghaieth, R.; Pinard, P. Residual Stresses in Science and Technology. Proceedings of the International Conference, Garmisch-Partenkirchen (FRG), Oct. 1986. pp. 343–352. Deutsche Gesellschaft fur Metallkunde, 1059 pp. (1987)


Publisher
Elsevier Science
Year
1990
Weight
200 KB
Volume
23
Category
Article
ISSN
0308-9126

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