๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Experiences with concurrent fault simulation of diagnostic programs

โœ Scribed by Demba, S.; Ulrich, E.; Lentz, K.P.; Giramma, D.


Book ID
119778083
Publisher
IEEE
Year
1990
Tongue
English
Weight
930 KB
Volume
9
Category
Article
ISSN
0278-0070

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Diagnostic simulation of stuck-at faults
โœ Sreejit Chakravarty; Yiming Gong; Srikanth Venkataraman ๐Ÿ“‚ Article ๐Ÿ“… 1996 ๐Ÿ› Springer US ๐ŸŒ English โš– 769 KB

Two faults are said to be equivalent, with respect to a test set T, iff they cannot be distinguished by any test in T. The sizes of the corresponding equivalence classes of faults are used as a basis for comparing the diagnostic capability of two given test sets. A novel algorithm, called "multiway