𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Exoelectron energy measurements on K2SO4 after X-ray irradiation and electron bombardment

✍ Scribed by Brunsmann, U. ;Scharmann, A.


Publisher
John Wiley and Sons
Year
1973
Tongue
English
Weight
496 KB
Volume
15
Category
Article
ISSN
0031-8965

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


X-ray diffraction characterization of mi
✍ Molodkin, V. B. ;Olikhovskii, S. I. ;Len, E. G. ;Sheludchenko, B. V. ;Lizunova, πŸ“‚ Article πŸ“… 2011 πŸ› John Wiley and Sons 🌐 English βš– 564 KB

## Abstract The quantitative characterization of complex microdefect structures in silicon crystals grown by Czochralski method and irradiated with various doses of high‐energy electrons (18 MeV) has been performed by methods of the high‐resolution X‐ray diffraction. The concentrations and average