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Exchange Bias Effect on the Relaxation Behavior of the IrMn/NiFe Bilayer System

✍ Scribed by Abdulahad, F.B.; Dung-Shung Hung; Yu-Che Chiu; Shang-Fan Lee

Book ID: 114654891
Publisher: IEEE
Year: 2011
Tongue: English
Weight: 514 KB
Volume: 47
Category: Article
ISSN: 0018-9464
DOI: 10.1109/tmag.2011.2157321

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