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Exchange bias effects of NiFe/NiO bilayers through ion-beam bombardment on the NiO surface

✍ Scribed by Li, Guijun; Leung, Chi Wah; Shueh, Chin; Hsu, Hsun-Feng; Huang, Hsuan-Rong; Lin, Ko-Wei; Lai, Pui To; Pong, Philip W.T.


Book ID
121451119
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
597 KB
Volume
228
Category
Article
ISSN
0257-8972

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