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Excess noise in AlGaAs/GaAs heterojunction bipolar transistors and associated TLM test structures

✍ Scribed by Delseny, C.; Pascal, F.; Jarrix, S.; Lecoy, G.; Dangla, J.; Dubon-Chevallier, C.

Book ID: 114535920
Publisher: IEEE
Year: 1994
Tongue: English
Weight: 641 KB
Volume: 41
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.333817

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