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EXAFS in photoelectron yield spectra at K edges of Cu, Ni, and Ge

โœ Scribed by Martens, G. ;Rabe, P. ;Tolkiehn, G. ;Werner, A.


Book ID
105374054
Publisher
John Wiley and Sons
Year
1979
Tongue
English
Weight
278 KB
Volume
55
Category
Article
ISSN
0031-8965

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EXAFS study of mixed nickel molybdenum o
โœ J. Gaidelene; R. Kalendarev; A. Kuzmin; J. Purans ๐Ÿ“‚ Article ๐Ÿ“… 2004 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 251 KB

Mixed nickel molybdenum oxide thin films were produced by DC magnetron co-sputtering technique with the nickel content about 8, 16 and 25 at%. X-ray absorption spectroscopy at the Ni and Mo K-edges was used to study the local atomic structure in the films. The best-fit analysis of the EXAFS signals