Phase determination in spin-polarized ne
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S. Farhad Masoudi; Ali Pazirandeh
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Article
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2005
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Elsevier Science
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English
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The scattering length density profile for a thin film structure can be determined uniquely if both the modulus and phase of the reflection coefficient is known. Here, we describe a method for recovering the phase information which utilize a magnetic substrate and based on polarization analysis of th