The scattering length density profile for a thin film structure can be determined uniquely if both the modulus and phase of the reflection coefficient is known. Here, we describe a method for recovering the phase information which utilize a magnetic substrate and based on polarization analysis of th
โฆ LIBER โฆ
Application of polarized neutron in determination of the phase in neutron reflectometry
โ Scribed by S. Farhad Masoudi; A. Pazirandeh
- Publisher
- Elsevier Science
- Year
- 2005
- Tongue
- English
- Weight
- 190 KB
- Volume
- 356
- Category
- Article
- ISSN
- 0921-4526
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