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Evolution of the dielectric breakdown in Co/Al[sub 2]O[sub 3]/Co junctions by annealing

✍ Scribed by Schmalhorst, J.; BruÌckl, H.; Justus, M.; Thomas, A.; Reiss, G.; Vieth, M.; Gieres, G.; Wecker, J.

No coin nor oath required. For personal study only.

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