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Evolution of surface-states density of Si/Wet thermal SiO2 interface during bias-temperature treatment : K. Saminadayar and J. C. Pfister. Solid-St. Electron.20, 891 (1977)


Book ID
103276564
Publisher
Elsevier Science
Year
1978
Tongue
English
Weight
131 KB
Volume
17
Category
Article
ISSN
0026-2714

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