Evidence of room temperature charging effects of silicon nanocrystals inside metal-oxide-semiconductor capacitors using feedback charge measurements

✍ Scribed by S. Ferraton; L. Montès; A. Souifi; J. Zimmermann

• Book ID: 114155623
• Publisher: Elsevier Science
• Year: 2003
• Tongue: English
• Weight: 267 KB
• Volume: 67-68
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/s0167-9317(03)00193-x