Evidence of a two-stage reaction mechanism in sputter deposited Nb/Al multilayer thin-films studied by in situ synchrotron X-ray diffraction

✍ Scribed by G. Lucadamo; K. Barmak; S. Hyun; C. Cabral Jr.; C. Lavoie

• Book ID: 117358711
• Publisher: Elsevier Science
• Year: 1999
• Tongue: English
• Weight: 402 KB
• Volume: 39
• Category: Article
• ISSN: 0167-577X
• DOI: 10.1016/s0167-577x(99)00017-8