Evaluation of the root-mean-square wavelength of machined 3D surface topography

✍ Scribed by Cheng-Gui Li; Shen Dong; Guo-Xiong Zhang

• Publisher: Elsevier Science
• Year: 1999
• Tongue: English
• Weight: 181 KB
• Volume: 232
• Category: Article
• ISSN: 0043-1648
• DOI: 10.1016/s0043-1648(99)00164-7

✦ Synopsis

Based on the application of fractal geometry theory, a quantitative evaluation method of root-mean-square wavelength of 3D stochastic surface topography is proposed, by means of the surface spectral moments. Through the FFT of the discrete data of the profile measured by a Talysurf-5 contact stylus instrument, we obtained the power spectrum and the fractal dimension of the profile. Furthermore, the zero and 2nd order spectral moments of the profile and the surface are found. Using these parameters, the evaluation of RMS wavelength may be processed. By the experiments for ground samples, the results confirm the correctness of this method.