Evaluation of reliability of low damage probability calculations for unitary structures
โ Scribed by A. O. Chernyavsky; A. V. Shadchin
- Book ID
- 111499869
- Publisher
- Allerton Press, Inc.
- Year
- 2010
- Tongue
- English
- Weight
- 212 KB
- Volume
- 39
- Category
- Article
- ISSN
- 1052-6188
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
As integrated circuits scale down into nanometer dimensions, a great reduction on the reliability of combinational blocks is expected. This way, the susceptibility of circuits to intermittent and transient faults is becoming a key parameter in the evaluation of logic circuits, and fast and accurate
The determination of mathematical reliability in static structures is still a motivating ยฎeld of research. On one hand, the failure probability values are of greater importance in engineering activities; on the other hand, the determination of this probability remains a time consuming computational