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Evaluation of paracrystalline lattice distortion by profile analysis using a single X-ray diffraction peak

✍ Scribed by Shigeo Yamamura; Yasunori Momose; Katsuhide Terada; Eihei Fukuoka

Book ID: 113368343
Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 529 KB
Volume: 133
Category: Article
ISSN: 0378-5173
DOI: 10.1016/0378-5173(95)04434-5

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