Evaluation of overshoot rate of lightning impulse withstand voltage test waveform based on new base curve fitting methods - study on overshoot waveform in an actual test circuit

✍ Scribed by Ueta, G.; Tsuboi, T.; Okabe, S.

• Book ID: 118065526
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 604 KB
• Volume: 18
• Category: Article
• ISSN: 1070-9878
• DOI: 10.1109/tdei.2011.5931066