Evaluation of overshoot rate of lightning impulse withstand voltage test waveform based on new base curve fitting methods - application to practical diverse waveforms

✍ Scribed by Ueta, G.; Tsuboi, T.; Okabe, S.

• Book ID: 118047690
• Publisher: IEEE
• Year: 2012
• Tongue: English
• Weight: 855 KB
• Volume: 19
• Category: Article
• ISSN: 1070-9878
• DOI: 10.1109/tdei.2012.6148538