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Evaluation of different purification procedures for production of at III concentrates

✍ Scribed by S. Arrighi; E.Bellizzi De Marco; P.L. Benanchi; M.G. Borri; F. Norelli; G. Roncucci

Book ID
119039223
Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
82 KB
Volume
65
Category
Article
ISSN
0049-3848

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Evaluation of diffusion length at differ
Evaluation of diffusion length at different excess carrier concentrations
✍ D. Cavalcoli; A. Cavallini πŸ“‚ Article πŸ“… 1994 πŸ› Elsevier Science 🌐 English βš– 251 KB

The charge collection technique of scanning electron microscopy is widely used to measure the minority carrier diffusion length L in semiconductors. In order to obtain L, the continuity equation for the excess carder concentration Ap must be solved with suitable boundary conditions. L is supposed to