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Evaluation of an STM-SQUID Probe Microscope

โœ Scribed by Watanabe, Norimichi; Hayashi, Tadayuki; Tachiki, Minoru; He, Dongfeng; Itozaki, Hideo

Book ID
118178918
Publisher
IEEE
Year
2011
Tongue
English
Weight
398 KB
Volume
21
Category
Article
ISSN
1051-8223

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A laser SQUID microscope has become a new tool for non-destructive evaluation of semiconductors. To improve the spatial resolution, a flux guide was introduced in the laser SQUID microscope. Using our laser SQUID microscope with and without the flux guide we have measured the magnetic field distribu