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Etch- and Transmission Electron Microscope Investigations of Microdefects in (001) LEC-GaP Substrates

✍ Scribed by Dr. V. Gottschalch; Dr. G. Wagner; Dr. M. Pasemann

Publisher: John Wiley and Sons
Year: 1981
Tongue: English
Weight: 485 KB
Volume: 16
Category: Article
ISSN: 0232-1300
DOI: 10.1002/crat.19810160908

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