Estimating component-defect probability from masked system success/failure data

✍ Scribed by Reiser, B.; Flehinger, B.J.; Conn, A.R.

• Book ID: 114555519
• Publisher: IEEE
• Year: 1996
• Tongue: English
• Weight: 490 KB
• Volume: 45
• Category: Article
• ISSN: 0018-9529
• DOI: 10.1109/24.510808