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Bayes estimation of component-reliability from masked system-life data

โœ Scribed by Lin, D.K.J.; Usher, J.S.; Guess, F.M.


Book ID
114555518
Publisher
IEEE
Year
1996
Tongue
English
Weight
435 KB
Volume
45
Category
Article
ISSN
0018-9529

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System reliability is often estimated by the use of components' reliability test results when system test data are not available, or are very scarce. A method is proposed for computing the exact posterior probability density function, cumulative distribution function, and credible intervals for syst