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ESR studies on radiation induced defects in high pressure phase SiO2

✍ Scribed by K. Ogoh; C. Yamanaka; S. Toyoda; M. Ikeya; E. Ito


Book ID
113286166
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
329 KB
Volume
91
Category
Article
ISSN
0168-583X

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