✦ LIBER ✦

Errors in Electron Microscope Determinations of Foil Thickness from Measurements of Trace Widths

✍ Scribed by Kelly, P. M.

Book ID: 105371173
Publisher: John Wiley and Sons
Year: 1975
Tongue: English
Weight: 242 KB
Volume: 32
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210320223

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## Abstract A new method for measuring the thickness of thin monocrystalline foils in the range of 1000 Å is presented. This method is based on the observation of Kossel‐Möllenstedt fringes in transmission electron microscopy. It differs from the classical Kossel‐Möllenstedt method in electron diff