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The Determination of the Orientation and Thickness of Thin Foils from Transmission Electron Micrographs

✍ Scribed by A. G. Crocker; M. Bevis

Publisher
John Wiley and Sons
Year
1964
Tongue
English
Weight
715 KB
Volume
6
Category
Article
ISSN
0370-1972

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πŸ“œ SIMILAR VOLUMES

A Method for Measuring the Thickness of
A Method for Measuring the Thickness of Thin Bent Foils in Transmission Electron Microscopy
✍ P. Delavignette; R. W. Vook πŸ“‚ Article πŸ“… 1963 πŸ› John Wiley and Sons 🌐 English βš– 357 KB

## Abstract A new method for measuring the thickness of thin monocrystalline foils in the range of 1000 Γ… is presented. This method is based on the observation of Kossel‐MΓΆllenstedt fringes in transmission electron microscopy. It differs from the classical Kossel‐MΓΆllenstedt method in electron diff