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Error Estimates for a Finite Element Method for the Drift-Diffusion Semiconductor Device Equations

✍ Scribed by Zhangxin Chen and Bernardo Cockburn

Book ID
124925636
Publisher
Society for Industrial and Applied Mathematics
Year
1994
Tongue
English
Weight
477 KB
Volume
31
Category
Article
ISSN
0036-1429

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Comparative study of finite element formulations for the semiconductor drift-diffusion equations
✍ J. T. Trattles; C. M. Johnson πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 183 KB πŸ‘ 2 views

A number of transient and steady-state finite element formulations of the semiconductor drift-diffusion equations are studied and compared with respect to their accuracy and efficiency on a simple test structure (the Mock diode). A new formulation, with a consistent interpolation function used to re