Erratum to “Defect-induced Si(100) dimer buckling structures studied by scanning tunneling microscopy” [Surface Science 357/358 (1996) 468]

✍ Scribed by Michihiro Uchikawa; Masahiko Ishida; Koji Miyake; Kenji Hata; Ryozo Yoshizaki; Hidemi Shigekawa

• Book ID: 117216941
• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 91 KB
• Volume: 369
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/s0039-6028(96)01205-8