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Defect-induced Si(100) dimer buckling structures studied by scanning tunneling microscopy

✍ Scribed by Michihiro Uchikawa; Masahiko Ishida; Koji Miyake; Kenji Hata; Ryozo Yoshizaki; Hidemi Shigekawa


Book ID
116068278
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
668 KB
Volume
357-358
Category
Article
ISSN
0039-6028

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